Invention Grant
- Patent Title: Automatic analysis apparatus and automatic analysis method
- Patent Title (中): 自动分析仪器及自动分析方法
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Application No.: US13145804Application Date: 2010-01-25
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Publication No.: US08997589B2Publication Date: 2015-04-07
- Inventor: Hidenobu Komatsu , Katsuhiro Kambara , Tetsuji Kawahara , Kentaro Wada
- Applicant: Hidenobu Komatsu , Katsuhiro Kambara , Tetsuji Kawahara , Kentaro Wada
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, P.C.
- Priority: JP2009-015717 20090127
- International Application: PCT/JP2010/050899 WO 20100125
- International Announcement: WO2010/087303 WO 20100805
- Main IPC: G01N1/00
- IPC: G01N1/00 ; G01N35/02 ; G01N35/00

Abstract:
A rack buffer unit 8 serving as a sample-container switching unit is provided between a rack conveying module 4 and a rack conveying module 5 which convey racks 2 on which the sample containers 1 are mounted, and an urgent-sample loading module 7 installing a rack 2 on which a sample container 1 storing a sample desired to be preferentially analyzed is mounted is provided. The rack 2 which is in the process of sample dispensing and the rack 2 desired to be preferentially analyzed are switched from each other by the rack buffer unit 8, and the sample container 1 mounted on the rack 2 desired to be preferentially analyzed is moved to a sample dispensing position in a short period of time.
Public/Granted literature
- US20110271773A1 AUTOMATIC ANALYSIS APPARATUS AND AUTOMATIC ANALYSIS METHOD Public/Granted day:2011-11-10
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