Invention Grant
US08999103B2 Substrate processing system, substrate processing method and storage medium
有权
基板处理系统,基板处理方法和存储介质
- Patent Title: Substrate processing system, substrate processing method and storage medium
- Patent Title (中): 基板处理系统,基板处理方法和存储介质
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Application No.: US11892661Application Date: 2007-08-24
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Publication No.: US08999103B2Publication Date: 2015-04-07
- Inventor: Shinji Wakabayashi
- Applicant: Shinji Wakabayashi
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Smith, Gambrell & Russell, LLP
- Priority: JP2006-229626 20060825
- Main IPC: C23F1/08
- IPC: C23F1/08 ; H01L21/3213 ; H01L21/67

Abstract:
In the vacuum substrate processing equipment of the present invention, a posttreatment chamber for carrying out a posttreatment in an atmospheric atmosphere adjoins a load-lock chamber. Products produced on a substrate during a vacuum process are removed by processing the substrate in the posttreatment chamber before the substrate is carried to an atmospheric carrying chamber in order to avoid or reduce adverse influence on the atmospheric carrying chamber. A carrying means installed in the said atmospheric carrying chamber carries the substrate to and from the said posttreatment chamber. The said posttreatment chamber and the atmospheric carrying chamber are separated from each other by a partition wall, and the partition wall is provided with an opening having the shape of a slit through which the said carrying means and the substrate can pass. The said carrying means carries the substrate into and out of the posttreatment chamber through the slit.
Public/Granted literature
- US20080053957A1 Substrate processing system, substrate processing method and storage medium Public/Granted day:2008-03-06
Information query
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