Invention Grant
- Patent Title: Embedded strip lot autocalibration
- Patent Title (中): 嵌入式条带自动校准
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Application No.: US12115770Application Date: 2008-05-06
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Publication No.: US08999125B2Publication Date: 2015-04-07
- Inventor: Gary T. Neel , Brent E. Modzelewski , Allan Javier Caban , Adam Mark Will , Carlos Oti
- Applicant: Gary T. Neel , Brent E. Modzelewski , Allan Javier Caban , Adam Mark Will , Carlos Oti
- Applicant Address: US FL Fort Lauderdale
- Assignee: Nipro Diagnostics, Inc.
- Current Assignee: Nipro Diagnostics, Inc.
- Current Assignee Address: US FL Fort Lauderdale
- Agency: Greenberg Traurig, LLP
- Agent David J. Dykeman; Roman Fayerberg
- Main IPC: G01N27/327
- IPC: G01N27/327 ; G01N33/487 ; C12Q1/54 ; G01N35/00
Abstract:
An auto-calibration system for diagnostic test strips is described for presenting data individually carried on each test strip readable by a diagnostic meter. The test strip meter may provide a predetermined varying resistance on one strip or a plurality of varying resistances from strip lot to strip lot.
Public/Granted literature
- US20090134024A1 Embedded Strip Lot Autocalibration Public/Granted day:2009-05-28
Information query
