Invention Grant
- Patent Title: Automatic analyzer
- Patent Title (中): 自动分析仪
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Application No.: US13546628Application Date: 2012-07-11
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Publication No.: US08999240B2Publication Date: 2015-04-07
- Inventor: Noriko Maeda , Kyoko Imai , Taku Sakazume , Yukie Tokiwa , Kantaro Suzuki
- Applicant: Noriko Maeda , Kyoko Imai , Taku Sakazume , Yukie Tokiwa , Kantaro Suzuki
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2005-255803 20050905
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N35/10 ; G06F17/00

Abstract:
An automatic analyzer and an automatic analyzing system to identify samples and reagents used in the analyzer and members used in measurement of at least two objects in common: system reagents or buffer solution; sensor parts; probes; nozzles; chips; dispensing cups; tubes; ISE electrodes; detectors; deionized water; and waste, and to unify management of identification information thereof and a measurement result.
Public/Granted literature
- US20120282141A1 AUTOMATIC ANALYZER Public/Granted day:2012-11-08
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