Invention Grant
- Patent Title: Specimen analyzer
- Patent Title (中): 标本分析仪
-
Application No.: US13417897Application Date: 2012-03-12
-
Publication No.: US08999241B2Publication Date: 2015-04-07
- Inventor: Hironori Katsumi , Tsuyoshi Fukuzaki
- Applicant: Hironori Katsumi , Tsuyoshi Fukuzaki
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Gilson & Lione
- Priority: JP2011-058480 20110316; JP2011-058481 20110316
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N35/04

Abstract:
A specimen analyzer comprising: a reagent refrigerator configured to store and cool a reagent container; a measurement unit configured to measure a specimen by using a reagent in the reagent container cooled by the reagent refrigerator; wherein the reagent refrigerator comprises: a housing configured so that an upper portion of the housing is openable and closable; a reagent container table configured so that the reagent container is set thereon, wherein the reagent container table is arranged within the housing so as to space away from a bottom of the housing; a first member arranged so as to face a side surface of the reagent container set on the reagent container table; and a second member arranged lower than the reagent container table, wherein the second member has a higher thermal conductivity than that of the first member.
Public/Granted literature
- US20120237398A1 SPECIMEN ANALYZER Public/Granted day:2012-09-20
Information query