Invention Grant
- Patent Title: Systems and methods for coating measurement
- Patent Title (中): 涂层测量的系统和方法
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Application No.: US14154360Application Date: 2014-01-14
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Publication No.: US08999429B2Publication Date: 2015-04-07
- Inventor: Larry Eugene Steenhoek , Allan Blase Joseph Rodrigues , Gerard T. Brosmer , David Lee Griffus
- Applicant: Axalta Coating Systems IP Co., LLC
- Applicant Address: US DE Wilmington
- Assignee: Axalta Coating Systems IP Co., LLC
- Current Assignee: Axalta Coating Systems IP Co., LLC
- Current Assignee Address: US DE Wilmington
- Agency: Ingrassia Fisher & Lorenz, P.C.
- Main IPC: B05D5/00
- IPC: B05D5/00 ; G01N33/32 ; G01N21/25 ; G01N21/55 ; G01N21/57 ; G01N21/84

Abstract:
Methods and systems for coating measurements are provided. A system for obtaining characteristics of a target coating layer include a clearcoat layer having a first surface and a second surface. A removable front support layer has an upper surface and a lower surface, where the lower surface is affixed over at least a portion of the second surface of the clearcoat layer. A back support layer has an inner surface and an outer surface, and at least a portion of the inner surface includes an adhesive layer. A separation layer is affixed over at least a portion of the adhesive layer, and the separation layer is removable from the adhesive layer.
Public/Granted literature
- US20140127395A1 SYSTEMS AND METHODS FOR COATING MEASUREMENT Public/Granted day:2014-05-08
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