Invention Grant
US08999833B1 Method and apparatus for controlling gate dimensions of memory devices
有权
用于控制存储器件的栅极尺寸的方法和装置
- Patent Title: Method and apparatus for controlling gate dimensions of memory devices
- Patent Title (中): 用于控制存储器件的栅极尺寸的方法和装置
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Application No.: US14045899Application Date: 2013-10-04
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Publication No.: US08999833B1Publication Date: 2015-04-07
- Inventor: Chang-Ming Wu , Shih-Chang Liu , Chia-Shiung Tsai
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L21/3205
- IPC: H01L21/3205 ; H01L21/4763 ; H01L29/423 ; H01L21/28 ; H01L27/115 ; H01L29/66 ; H01L29/788

Abstract:
A device comprises a control gate structure over a substrate, a memory gate structure over the substrate, wherein the memory gate structure comprises a memory gate electrode and a memory gate spacer, and wherein the memory gate spacer is over the memory gate electrode, a charge storage layer formed between the control gate structure and the memory gate structure, wherein the charge storage layer is an L-shaped structure, a first spacer along a sidewall of the memory gate structure, a first drain/source region formed in the substrate and adjacent to the memory gate structure and a second drain/source region formed in the substrate and adjacent to the control gate structure.
Public/Granted literature
- US20150097223A1 METHOD AND APPARATUS FOR CONTROLLING GATE DIMENSIONS OF MEMORY DEVICES Public/Granted day:2015-04-09
Information query
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