Invention Grant
US09000434B2 Visual indicator for semiconductor chips for indicating mechanical damage
有权
用于指示机械损伤的半导体芯片的视觉指示器
- Patent Title: Visual indicator for semiconductor chips for indicating mechanical damage
- Patent Title (中): 用于指示机械损伤的半导体芯片的视觉指示器
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Application No.: US13709914Application Date: 2012-12-10
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Publication No.: US09000434B2Publication Date: 2015-04-07
- Inventor: Richard Carson , Elaine Taylor , Douglas Collins
- Applicant: Emcore Corporation
- Applicant Address: US NM Albuquerque
- Assignee: Emcore Corporation
- Current Assignee: Emcore Corporation
- Current Assignee Address: US NM Albuquerque
- Main IPC: H01L29/10
- IPC: H01L29/10 ; H01S5/30 ; H01L23/58 ; H01L23/60 ; H01L27/02 ; H01L27/04
Abstract:
A semiconductor device including a semiconductor substrate having a surface including an active semiconductor device including one of a laser and a photodiode; and a visual indicator disposed on the semiconductor body and at least adjacent to a portion of said active semiconductor device, the indicator having a state that shows if damage to the active semiconductor device may have occurred.
Public/Granted literature
- US20130094531A1 VISUAL INDICATOR FOR SEMICONDUCTOR CHIPS FOR INDICATING MECHANICAL OR ESD DAMAGE Public/Granted day:2013-04-18
Information query
IPC分类:
