A TFT-LCD array substrate includes a display area, a peripheral area located at a periphery of the display area, and a connecting device. Wherein, the display area includes a plurality of data lines and gate lines. The peripheral area provides with a first test short bar provided with a plurality of data test lines for transmitting a test signal for the data lines, and a second test short bar provided with a gate test line for transmitting a test signal for the gate lines. The connecting device includes a first connection layer and a second connection layer. The connecting device is disposed at a connection location between one of the data test lines and one of the data lines, or between the gate test line and one of the gate lines. A test method for testing the TFT-LCD array substrate is also provided.