Invention Grant
US09000810B2 Quantizer, comparator circuit, and semiconductor integrated circuit
有权
量化器，比较器电路和半导体集成电路
- Patent Title: Quantizer, comparator circuit, and semiconductor integrated circuit
- Patent Title (中): 量化器，比较器电路和半导体集成电路
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Application No.: US14075763Application Date: 2013-11-08
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Publication No.: US09000810B2Publication Date: 2015-04-07
- Inventor: Hiroyuki Nakamoto , Hideta Oki
- Applicant: Fujitsu Limited , Fujitsu Semiconductor Limited
- Applicant Address: JP Kawasaki JP Yokohama
- Assignee: Fujitsu Limited,Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Limited,Fujitsu Semiconductor Limited
- Current Assignee Address: JP Kawasaki JP Yokohama
- Agency: Arent Fox LLP
- Priority: JP2012-275540 20121218
- Main IPC: H03K3/00
- IPC: H03K3/00 ; H03M1/12
Abstract:
A quantizer takes an analog signal as input and produces a quantized signal for output. The quantizer includes a shoot-through current detection unit and a feedback unit. The shoot-through current detection unit is configured to detect a shoot-through current flowing through the quantizer. The feedback unit is configured to feed back a signal from the shoot-through current detection unit and control an electric charge stored at an input of the quantizer.
Public/Granted literature
- US20140167824A1 QUANTIZER, COMPARATOR CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT Public/Granted day:2014-06-19
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