Invention Grant
- Patent Title: Arrangement to measure the deflection of an object
- Patent Title (中): 用于测量物体偏转的布置
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Application No.: US13362042Application Date: 2012-01-31
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Publication No.: US09000970B2Publication Date: 2015-04-07
- Inventor: Jimmi Andersen , Per Egedal , Henrik Stiesdal , Andreas Ziroff
- Applicant: Jimmi Andersen , Per Egedal , Henrik Stiesdal , Andreas Ziroff
- Applicant Address: DE München
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE München
- Priority: EP11153559 20110207
- Main IPC: H01Q15/00
- IPC: H01Q15/00 ; G01B15/06 ; G01S3/48 ; G01S13/42 ; G01S13/88 ; G01S13/75
Abstract:
A reflector is arranged at a first position, which is assigned to a first end of the object. An antenna-system is arranged at a second position, which is assigned to a second end of the object. The antenna system contains a transmit antenna and a receive antenna, while the reflector and the antenna-system are coupled by a radio signal. The radio signal is sent from the transmit antenna via the reflector towards the receive antenna. The receive antenna is connected with an evaluation unit, which is prepared to measure the deflection between the first end of the object and the second end of the object based on the received radio signal.
Public/Granted literature
- US20120200444A1 Arrangement to measure the deflection of an object Public/Granted day:2012-08-09
Information query
