A method for testing an integrated circuit includes, in a burn-in test mode, two steps during which gate oxides of conductive high voltage MOS transistors of the integrated circuit are subjected to a first test voltage, and blocked high voltage MOS transistors of the integrated circuit are subjected to a second test voltage. The first test voltage is set to a value higher than a high supply voltage supplied to the high voltage MOS transistors in a normal operating mode, to make the gate oxides of transistors considered as insufficiently robust break down. The second test voltage is set to a value lower than the first test voltage and which can be supported by the blocked transistors, the states of the transistors being changed between the two steps.