Invention Grant
- Patent Title: System and method for simulating measuring process of workpiece
- Patent Title (中): 用于模拟工件测量过程的系统和方法
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Application No.: US13316489Application Date: 2011-12-10
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Publication No.: US09002688B2Publication Date: 2015-04-07
- Inventor: Chih-Kuang Chang , Xin-Yuan Wu , Min Wang
- Applicant: Chih-Kuang Chang , Xin-Yuan Wu , Min Wang
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201110031179 20110128
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G01B21/04 ; G05B19/401

Abstract:
In a method for simulating a measuring process of a workpiece, one or more virtual probes of a workpiece measuring machine are created. A vector of each of the virtual probes is calculated, and an appropriate vector for each of measuring points of a workpiece is acquired for a computerized drawing of the workpiece. The angle between the vector of each of the measuring points and the vector of each of the virtual probes is calculated. A virtual probe is determined for each measuring point according to the calculated angles. The measuring points are sorted according to the virtual probe of each measuring point, and the measuring programs of the sorted measuring points that relate to the same virtual probe are combined. The combined measuring programs are executed to determine whether the actual probe would collide with the workpiece.
Public/Granted literature
- US20120197615A1 SYSTEM AND METHOD FOR SIMULATING MEASURING PROCESS OF WORKPIECE Public/Granted day:2012-08-02
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