Invention Grant
- Patent Title: Identifying anomalies in original metrics of a system
- Patent Title (中): 识别系统原始度量的异常
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Application No.: US13904556Application Date: 2013-05-29
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Publication No.: US09003076B2Publication Date: 2015-04-07
- Inventor: Alain E. Biem
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Jeff Tang, Esq.; Blanche E. Schiller, Esq.
- Main IPC: H04N9/64
- IPC: H04N9/64 ; G06F11/30 ; H04N5/217
Abstract:
An anomalous component within a processing system is identified. One or more transformed metrics of a processing system being monitored are analyzed, and an anomaly in the processing system is detected. Based on detecting the anomaly, at least one transformed metric is inversely transformed to obtain at least one suspect original metric. Using the at least one suspect original metric, the anomalous component is identified.
Public/Granted literature
- US20140359363A1 IDENTIFYING ANOMALIES IN ORIGINAL METRICS OF A SYSTEM Public/Granted day:2014-12-04
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