Invention Grant
- Patent Title: Partial-writes to ECC (error check code) enabled memories
- Patent Title (中): 部分写入ECC（错误检查码）启用的存储器
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Application No.: US13424564Application Date: 2012-03-20
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Publication No.: US09003260B2Publication Date: 2015-04-07
- Inventor: Saya Goud Langadi , Padmini Sampath
- Applicant: Saya Goud Langadi , Padmini Sampath
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Frank D. Cimino
- Priority: IN2200/CHE/2011 20110629
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F13/16
Abstract:
A memory system includes a memory and a memory controller coupled to the memory. The memory controller includes a data buffer configured to store a full data word as a result of a partial write operation, wherein for a subsequent partial write operation, data is read from the data buffer.
Public/Granted literature
- US20130007574A1 Partial-Writes to ECC (Error Check Code) Enabled Memories Public/Granted day:2013-01-03
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