Invention Grant
- Patent Title: Program for test case generation based on use case diagram and method for test case generation using the same
- Patent Title (中): 基于用例图和测试用例生成方法的测试用例生成程序
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Application No.: US13072670Application Date: 2011-03-25
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Publication No.: US09003368B2Publication Date: 2015-04-07
- Inventor: Wooyeol Kim , Hyunseung Son , Robertyoungchul Kim , Suchun Jin
- Applicant: Wooyeol Kim , Hyunseung Son , Robertyoungchul Kim , Suchun Jin
- Applicant Address: KR KR
- Assignee: Hongik University Industry-Academic Cooperation Foundation,Hanback Electronics Co., Ltd
- Current Assignee: Hongik University Industry-Academic Cooperation Foundation,Hanback Electronics Co., Ltd
- Current Assignee Address: KR KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2010-102376 20101020
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06N5/04 ; G06F11/36

Abstract:
In the program for generating a test case based on a use case diagram and the method for generating a test case using the same according to exemplary embodiments of the present invention, since a use case specification specifying a procedure or method scenario performed in a use case diagram is used to complement insufficient information of a use case diagram used to extract a test case, a layer, although he is not a specialist or an expert, can easily generate a certain level of a test case to effectively perform a test. Thus, requirements can be verified in advance by generating a test case from a use case program, reducing the costs for a system development.
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