Invention Grant
- Patent Title: Selective etching of copper and copper-barrier materials by an aqueous base solution with fluoride addition
- Patent Title (中): 通过氟化物添加的碱性水溶液选择性蚀刻铜和铜屏障材料
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Application No.: US13857696Application Date: 2013-04-05
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Publication No.: US09012322B2Publication Date: 2015-04-21
- Inventor: Anh Duong , Errol Todd Ryan
- Applicant: Intermolecular Inc.
- Applicant Address: US CA San Jose
- Assignee: Intermolecular, Inc.
- Current Assignee: Intermolecular, Inc.
- Current Assignee Address: US CA San Jose
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L21/768 ; H01L21/3213 ; C23F1/34

Abstract:
Wet-etch solutions for conductive metals (e.g., copper) and metal nitrides (e.g., tantalum nitride) can be tuned to differentially etch the conductive metals and metal nitrides while having very little effect on nearby oxides (e.g., silicon dioxide hard mask materials), and etching refractory metals (e.g. tantalum) at an intermediate rate. The solutions are aqueous base solutions (e.g., ammonia-peroxide mixture or TMAH-peroxide mixture) with just enough hydrofluoric acid (HF) added to make the solution's pH about 8-10. Applications include metallization of sub-micron logic structures.
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