Invention Grant
- Patent Title: Apparatus and method for sensing failure
- Patent Title (中): 用于感测故障的装置和方法
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Application No.: US13338007Application Date: 2011-12-27
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Publication No.: US09013188B2Publication Date: 2015-04-21
- Inventor: Kyung Pil Nam
- Applicant: Kyung Pil Nam
- Applicant Address: KR Seoul
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: McDermott Will & Emery LLP
- Priority: KR10-2011-0004406 20110117
- Main IPC: G01R31/00
- IPC: G01R31/00 ; H05B33/08 ; H05B37/03

Abstract:
Provided is an apparatus for sensing a failure that may apply, using a current control unit, a current to at least one first light emitting diode (LED) string and at least one second LED string that may be connected in parallel with each other, and as a result of sensing whether a failure occurs with respect to each of the at least one first LED string and the at least one second LED string, when a failure is sensed with respect to at least one of the at least one first LED string and the at least one second LED string, may transmit failure information to the current control unit, thereby blocking the entire current that may be applied to the at least one first LED string and the at least one second LED string, using the current control unit.
Public/Granted literature
- US20120182018A1 APPARATUS AND METHOD FOR SENSING FAILURE Public/Granted day:2012-07-19
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