Invention Grant
- Patent Title: Testing apparatus and testing method
- Patent Title (中): 检测仪器及检测方法
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Application No.: US14058741Application Date: 2013-10-21
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Publication No.: US09013205B2Publication Date: 2015-04-21
- Inventor: Lien-Feng Chen , Chun-Hao Chu
- Applicant: Inventec (Pudong) Technology Corporation , Inventec Corporation
- Applicant Address: CN Shanghai TW Taipei
- Assignee: Inventec (Pudong) Technology Corporation,Inventec Corporation
- Current Assignee: Inventec (Pudong) Technology Corporation,Inventec Corporation
- Current Assignee Address: CN Shanghai TW Taipei
- Agency: Morris, Manning & Martin, LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: CN201310192546 20130522
- Main IPC: G01R31/40
- IPC: G01R31/40 ; G01R31/02 ; G01R31/28 ; G06F11/273 ; G06F11/36

Abstract:
The present disclosure provides a testing apparatus for executing a test program, to perform a first test on a circuit component on a circuit board and a second test on the circuit board. The testing apparatus includes a first module, a second module, and a signal transmission line that connects the two. The first module includes a control unit, a signal generation unit, a signal processing unit, a signal expansion unit, and a power supply unit. The control unit generates a first control signal or a second control signal. The signal generation unit generates a current signal or a voltage signal. The signal processing unit generates a numerical signal. The signal expansion unit generates a second data signal. The power supply unit generates a working voltage. The second module includes a test address assignment unit that assigns an address and a signal isolation unit that performs noise immunization process.
Public/Granted literature
- US20140351641A1 TESTING APPARATUS AND TESTING METHOD Public/Granted day:2014-11-27
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