Invention Grant
US09013937B2 Semiconductor device, method for inspecting the same, and method for driving the same 有权
半导体装置及其检查方法及其驱动方法

Semiconductor device, method for inspecting the same, and method for driving the same
Abstract:
A method for limiting writing of data to a specific memory cell without disconnecting a wiring of a memory cell array or placing a prober in contact with a memory cell, a row, or a column is provided. Row address data and column address data of a memory cell to which data cannot be written are stored in a register. Enable data which controls data writing is stored in the register. Next, in order to write data to a memory cell, row address data and column address data of a memory cell to which data is written, writing enable data, and the like are output from a logic circuit; thus, writing of data to a memory cell corresponding to the address data stored in the register is inhibited.
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