Invention Grant
- Patent Title: Semiconductor device, method for inspecting the same, and method for driving the same
- Patent Title (中): 半导体装置及其检查方法及其驱动方法
-
Application No.: US14295816Application Date: 2014-06-04
-
Publication No.: US09013937B2Publication Date: 2015-04-21
- Inventor: Seiichi Yoneda
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP
- Agency: Husch Blackwell LLP
- Priority: JP2010-183748 20100819
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C29/04 ; G11C7/10 ; G11C29/00

Abstract:
A method for limiting writing of data to a specific memory cell without disconnecting a wiring of a memory cell array or placing a prober in contact with a memory cell, a row, or a column is provided. Row address data and column address data of a memory cell to which data cannot be written are stored in a register. Enable data which controls data writing is stored in the register. Next, in order to write data to a memory cell, row address data and column address data of a memory cell to which data is written, writing enable data, and the like are output from a logic circuit; thus, writing of data to a memory cell corresponding to the address data stored in the register is inhibited.
Public/Granted literature
- US20140286114A1 Semiconductor Device, Method for Inspecting the Same, and Method for Driving the Same Public/Granted day:2014-09-25
Information query