Invention Grant
- Patent Title: Device and method for performing timing analysis
- Patent Title (中): 用于执行时序分析的装置和方法
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Application No.: US13798879Application Date: 2013-03-13
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Publication No.: US09015541B2Publication Date: 2015-04-21
- Inventor: Yu-Chen Shen , Yi-Hao Hsu
- Applicant: Test Research, Inc.
- Applicant Address: TW Taipei
- Assignee: Test Research, Inc.
- Current Assignee: Test Research, Inc.
- Current Assignee Address: TW Taipei
- Agency: McDermott Will & Emery LLP
- Priority: TW102101773A 20130117
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/319 ; G01R31/3193

Abstract:
A device for performing timing analysis used in a programmable logic array system is provided. The device comprises first and second basic I/O terminals, a channel multiplexer, high-speed I/O terminals, a sampling module and a timing analysis module. The first basic I/O terminals receive under-test signals from an under-test unit. The channel multiplexer receives the under-test signals from the first basic I/O terminals to select at least a group of the under-test signals to be outputted to the second basic I/O terminals. The high-speed I/O terminals has a logic level analyzing speed higher than that of the first and second basic I/O terminals. The sampling module receives the group of under-test signals from the high-speed I/O terminals and samples the group of under-test signals to generate a sample result. The timing analysis module performs timing analysis and measurement according to the sample result.
Public/Granted literature
- US20140201581A1 DEVICE AND METHOD FOR PERFORMING TIMING ANALYSIS Public/Granted day:2014-07-17
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