Invention Grant
- Patent Title: System reliability evaluation device
- Patent Title (中): 系统可靠性评估装置
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Application No.: US13640454Application Date: 2011-01-21
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Publication No.: US09015675B2Publication Date: 2015-04-21
- Inventor: Fumio Machida
- Applicant: Fumio Machida
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-091956 20100413
- International Application: PCT/JP2011/000303 WO 20110121
- International Announcement: WO2011/129038 WO 20111020
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/10 ; G06F11/36
Abstract:
A system reliability evaluation device 1000 includes a system reliability evaluating part 1100 that, based on connection defect information including the number of times that a defect has occurred in a connection between software components among a plurality of software components operating in connection with each other, evaluates system reliability which is the reliability of an information processing system executing the software.
Public/Granted literature
- US20130031533A1 SYSTEM RELIABILITY EVALUATION DEVICE Public/Granted day:2013-01-31
Information query
