Invention Grant
- Patent Title: Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source
- Patent Title (中): 通过用聚集源沉积纳米颗粒来改变原子力显微镜尖端
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Application No.: US13697598Application Date: 2011-05-04
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Publication No.: US09015861B2Publication Date: 2015-04-21
- Inventor: Elisa Leonor Román García , Lidia Martínez Orellana , Mercedes Díaz Lagos , Yves Huttel
- Applicant: Elisa Leonor Román García , Lidia Martínez Orellana , Mercedes Díaz Lagos , Yves Huttel
- Applicant Address: ES Madrid
- Assignee: Consejo Superior de Investigaciones Cientificas (CSIC)
- Current Assignee: Consejo Superior de Investigaciones Cientificas (CSIC)
- Current Assignee Address: ES Madrid
- Agency: Porzio, Bromberg & Newman, P.C.
- Priority: ES201030712 20100513
- International Application: PCT/ES2011/070319 WO 20110504
- International Announcement: WO2011/141602 WO 20111117
- Main IPC: G01Q70/12
- IPC: G01Q70/12 ; G01Q60/38 ; G01Q60/42 ; B82Y15/00 ; B82Y35/00
Abstract:
The present invention relates to a method for covering Atomic Force Microscopy (AFM) tips by depositing a material in the form of nanoparticles with an aggregate source.
Public/Granted literature
- US20130111637A1 MODIFICATION OF ATOMIC FORCE MICROSCOPY TIPS BY DEPOSITION OF NANOPARTICLES WITH AN AGGREGATE SOURCE Public/Granted day:2013-05-02
Information query
