Invention Grant
- Patent Title: Apparatus and methods for microwave processing of semiconductor substrates
- Patent Title (中): 半导体衬底的微波处理装置和方法
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Application No.: US14112012Application Date: 2012-03-29
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Publication No.: US09018110B2Publication Date: 2015-04-28
- Inventor: Michael W. Stowell , Majeed A. Foad , Ralf Hofmann , Wolfgang R. Aderhold , Stephen Moffatt
- Applicant: Michael W. Stowell , Majeed A. Foad , Ralf Hofmann , Wolfgang R. Aderhold , Stephen Moffatt
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- International Application: PCT/US2012/031140 WO 20120329
- International Announcement: WO2012/148621 WO 20121101
- Main IPC: H01L23/66
- IPC: H01L23/66 ; H01L21/263 ; H01L21/324 ; H01L21/67 ; H05B6/70

Abstract:
Methods and apparatus for radiation processing of semiconductor substrates using microwave or millimeter wave energy are provided. The microwave or millimeter wave energy may have a frequency between about 600 MHz and about 1 THz. Alternating current from a magnetron is coupled to a leaky microwave emitter that has an inner conductor and an outer conductor, the outer conductor having openings with a dimension smaller than a wavelength of the emitted radiation. The inner and outer conductors are separated by an insulating material. Interference patterns produced by the microwave emissions may be uniformized by phase modulating the power to the emitter and/or by frequency modulating the frequency of the power itself. Power from a single generator may be divided to two or more emitters by a power divider.
Public/Granted literature
- US20140038431A1 APPARATUS AND METHODS FOR MICROWAVE PROCESSING OF SEMICONDUCTOR SUBSTRATES Public/Granted day:2014-02-06
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