Invention Grant
- Patent Title: Range sensor and range image sensor
- Patent Title (中): 量程传感器和量程图像传感器
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Application No.: US13498237Application Date: 2010-11-18
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Publication No.: US09019478B2Publication Date: 2015-04-28
- Inventor: Takashi Suzuki , Mitsuhito Mase
- Applicant: Takashi Suzuki , Mitsuhito Mase
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2009-266566 20091124; JP2010-229906 20101012
- International Application: PCT/JP2010/070578 WO 20101118
- International Announcement: WO2011/065280 WO 20110603
- Main IPC: G01C3/08
- IPC: G01C3/08 ; H01L27/146 ; G01S7/481 ; G01S7/486 ; G01S17/89

Abstract:
A range image sensor RS is provided with an imaging region consisting of a plurality of units arranged in a two-dimensional pattern, on a semiconductor substrate 1 and obtains a range image, based on charge quantities output from the units. One unit is provided with a photosensitive region, a plurality of third semiconductor regions 9a, 9b opposed to each other with a photogate electrode PG in between in a direction in which first and second long sides L1, L2 are opposed to each other, first and second transfer electrodes TX1, TX2 provided between the plurality of third semiconductor regions 9a, 9b and the photogate electrode PG, a plurality of fourth semiconductor regions 11a, 11b arranged with the third semiconductor regions 9a, 9b in between in the direction in which the first and second long sides L1, L2 are opposed to each other, and a plurality of third transfer electrodes TX3 provided respectively between the plurality of fourth semiconductor regions 11a, 11b and the photogate electrode PG.
Public/Granted literature
- US20120182540A1 RANGE SENSOR AND RANGE IMAGE SENSOR Public/Granted day:2012-07-19
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