Invention Grant
- Patent Title: State determination in resistance variable memory
- Patent Title (中): 电阻变量记忆状态确定
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Application No.: US14109329Application Date: 2013-12-17
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Publication No.: US09019754B1Publication Date: 2015-04-28
- Inventor: Ferdinando Bedeschi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; G11C11/16

Abstract:
An evaluation signal is applied to a memory cell in an array of resistance variable memory cells. The evaluation signal is configured to cause the memory cell to switch from a first state to a second state. Responses from the memory cell are sensed at three or more sample points. Differences between the responses are determined. For example, with three sample points, a first delta is determined between the first two responses and a second delta is determined between the last two responses. A difference of deltas is determined as a difference between the first and second delta, or vice versa. It is determined that the memory cell changes from the first to the second state if the difference of deltas is above a threshold. It is determined that the memory cell remains in the second state if the difference of deltas is below the threshold.
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