Invention Grant
- Patent Title: Maintenance operation instance collection apparatus, maintenance operation instance collection method, and maintenance operation instance collection program
- Patent Title (中): 维护操作实例收集装置,维护操作实例收集方法和维护操作实例收集程序
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Application No.: US13702771Application Date: 2010-06-08
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Publication No.: US09020942B2Publication Date: 2015-04-28
- Inventor: Hiroki Uchiyama , Shinya Yuda , Kozo Nakamura
- Applicant: Hiroki Uchiyama , Shinya Yuda , Kozo Nakamura
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- International Application: PCT/JP2010/059657 WO 20100608
- International Announcement: WO2011/155023 WO 20111215
- Main IPC: G06F17/30
- IPC: G06F17/30 ; G06Q10/00 ; G06Q30/00

Abstract:
A maintenance operation instance collection apparatus includes: a storage unit that includes a maintenance operation instance database in which operation information obtained from a device via a sensor and maintenance information on a measure to deal with the operation information corresponding thereto are stored in association with each other; and a control unit that receives an input of new operation information, receives an input of new maintenance information, searches the maintenance operation instance database using the newly-received maintenance information as a search key, acquires searched operation information, compares the newly-received operation information to the acquired operation information, determines whether or not the newly-received operation information is close to the acquired operation information in such a degree of satisfying a prescribed criterion, and, if the newly-received operation information is not determined to be close to the acquired operation information, prompts a re-input of the newly-received maintenance information.
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