Invention Grant
- Patent Title: Analysis method and imaging apparatus
- Patent Title (中): 分析方法和成像装置
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Application No.: US13783711Application Date: 2013-03-04
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Publication No.: US09024258B2Publication Date: 2015-05-05
- Inventor: Tsugio Gomi
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2012-074280 20120328
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01J3/12 ; G01J3/10 ; G01J3/26 ; G01J3/28 ; G01J3/02

Abstract:
An analysis method includes spectroscopically separating light from a light source via a subject into plural wavelength ranges, imaging the subject with respect to each wavelength range, and thereby, acquiring plural spectroscopic images, dividing a subject image into plural areas in each of the spectroscopic images, analyzing a spectrum of the spectroscopically-separated lights of each area with respect to the plural spectroscopic images, and thereby, analyzing a spectral characteristic, and analyzing a component of the subject based on the spectral characteristic in at least one area of the plural areas, and has a pixel selection step of eliminating the area having the same spectral characteristic as the spectral characteristic with respect to the light from the light source from objects of the analysis of the component before the analyzing of the component.
Public/Granted literature
- US20130258314A1 ANALYSIS METHOD AND IMAGING APPARATUS Public/Granted day:2013-10-03
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