Invention Grant
- Patent Title: Method and device for high resolution full field interference microscopy
- Patent Title (中): 高分辨率全场干涉显微镜的方法和装置
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Application No.: US13698738Application Date: 2011-05-17
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Publication No.: US09025150B2Publication Date: 2015-05-05
- Inventor: Albert Claude Boccara , Fabrice Harms , Bertrand Le Conte Chrestien de Poly
- Applicant: Albert Claude Boccara , Fabrice Harms , Bertrand Le Conte Chrestien de Poly
- Applicant Address: FR Paris
- Assignee: LLTech Management
- Current Assignee: LLTech Management
- Current Assignee Address: FR Paris
- Agency: Osha Liang LLP
- Priority: FR1053833 20100518
- International Application: PCT/EP2011/057997 WO 20110517
- International Announcement: WO2011/144632 WO 20111124
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01B9/02 ; G01B9/04 ; G02B21/00 ; G02B26/06

Abstract:
The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element (404) for modifying the phase of the wavefront, and the microscopy device comprises a control unit (405) for the optical element, linked to the processing unit (403), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.
Public/Granted literature
- US20130107268A1 METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY Public/Granted day:2013-05-02
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