Invention Grant
- Patent Title: Method and apparatus for sensing tunnel magneto-resistance
- Patent Title (中): 感应隧道磁阻的方法和装置
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Application No.: US14089893Application Date: 2013-11-26
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Publication No.: US09025367B1Publication Date: 2015-05-05
- Inventor: Chia-Liang Lin
- Applicant: Realtek Semiconductor Corp.
- Applicant Address: TW Hsinchu
- Assignee: Realtek Semiconductor Corp.
- Current Assignee: Realtek Semiconductor Corp.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/16

Abstract:
In one embodiment, an apparatus comprises: an MRAM (magnetic random access memory) cell array comprising a plurality of MRAM cells including a calibration cell and a plurality of data cells; a reference MRAM cell controlled by a control signal; and a sensing-amplifier/latch; wherein: said plurality of data cells are used for storing user data; the calibration cell is used for a calibration purpose; the reference MRAM cell serves as a reference for comparison with a MRAM cell selected within the MRAM cell array; the sensing-amplifier/latch outputs a logical signal based on comparing a resistance of the MRAM cell selected within the MRAM cell array and a resistance of the reference MRAM cell; and the control signal is established in a calibration process by comparing a resistance of the calibration cell with the resistance of the reference MRAM cell.
Public/Granted literature
- US20150146481A1 METHOD AND APPARATUS FOR SENSING TUNNEL MAGNETO-RESISTANCE Public/Granted day:2015-05-28
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