Invention Grant
- Patent Title: Resistance change nonvolatile semiconductor memory device
- Patent Title (中): 电阻变化非易失性半导体存储器件
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Application No.: US13424201Application Date: 2012-03-19
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Publication No.: US09025369B2Publication Date: 2015-05-05
- Inventor: Daisaburo Takashima
- Applicant: Daisaburo Takashima
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: JP2011-064931 20110323
- Main IPC: G11C11/00
- IPC: G11C11/00 ; H01L45/00 ; H01L27/24 ; G11C11/56 ; G11C13/00

Abstract:
According to one embodiment, a phase change memory includes a memory cell, a select transistor, and a memory cell array. The memory cell includes a chalcogenide wiring, resistance wirings and a cell transistor. The chalcogenide wiring becomes a heater. One end of a plurality of memory cells with sources and drains connected in series is connected to a source of the select transistor. The bit line is connected a drain of the select transistor. The memory cell array is obtained by forming a memory cell string.
Public/Granted literature
- US20120243307A1 RESISTANCE CHANGE NONVOLATILE SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2012-09-27
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