Invention Grant
- Patent Title: Memory device with reduced neighbor memory cell disturbance
- Patent Title (中): 具有减少的相邻存储器单元干扰的存储器件
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Application No.: US14132390Application Date: 2013-12-18
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Publication No.: US09025392B1Publication Date: 2015-05-05
- Inventor: Efrem Bolandrina , Daniele Vimercati
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Knobbe, Martens, Olson & Bear LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C13/00

Abstract:
In one embodiment, an apparatus, such as a memory device, is disclosed. The apparatus includes a memory cell, digit line driver, access line driver, clamping element, and control circuit. The memory cell and clamping element can be both coupled to a digit line. The control circuit can be configured to cause the clamping element to clamp the voltage of the digit line for a period of time while the digit line driver is caused to bias the digit line at a voltage level sufficient to enable selection of the memory cell. In addition, the control circuit can be configured to cause the access line driver to bias an access line coupled to memory cell when the voltage of the digit line is at the voltage level sufficient to enable selection of the memory cell.
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