Invention Grant
- Patent Title: Method for measuring an object
- Patent Title (中): 测量物体的方法
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Application No.: US13202476Application Date: 2010-02-19
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Publication No.: US09025855B1Publication Date: 2015-05-05
- Inventor: Ralf Christoph , Ingomar Schmidt , Michael Hammer , Thomas Wiedenhöfer
- Applicant: Ralf Christoph , Ingomar Schmidt , Michael Hammer , Thomas Wiedenhöfer
- Applicant Address: DE Giessen
- Assignee: Werth Messtechnik GmbH
- Current Assignee: Werth Messtechnik GmbH
- Current Assignee Address: DE Giessen
- Agency: Ladas & Parry LLP
- Priority: DE102009003514 20090220; DE102009003597 20090310; DE102009003826 20090424; DE102009025846 20090520; DE102009026198 20090717; DE102009043838 20090824; DE102009044476 20091109; DE102009044580 20091118
- International Application: PCT/EP2010/052145 WO 20100219
- International Announcement: WO2010/094774 WO 20100826
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G06T11/00 ; G06T5/00

Abstract:
A method for determining structures or geometry of an object, or for measuring an object using a CT measuring system, and for correcting projection data for a CT reconstruction with the application of a CT detector, wherein the CT measuring system includes at least one radiation source, at least one radiation detector, and at least one axis of rotation.
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