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US09026876B2 Pattern-dependent short media defect detection 有权
模式依赖的短介质缺陷检测

Pattern-dependent short media defect detection
Abstract:
Systems and methods for computing sign disagreement between signals may implement one or more operations including, but not limited to: receiving an extrinsic log likelihood ratio (LLR) value; incrementing a sign-disagreement counter according to a sign disagreement between the extrinsic LLR value and an a priori LLR value; providing a value of the sign-disagreement counter to a binary short media defect (SMD) detector; and detecting one or more consecutive sign disagreements between an extrinsic output of a detector and an extrinsic output of a decoder.
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