Invention Grant
- Patent Title: Pattern-dependent short media defect detection
- Patent Title (中): 模式依赖的短介质缺陷检测
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Application No.: US13631075Application Date: 2012-09-28
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Publication No.: US09026876B2Publication Date: 2015-05-05
- Inventor: Fan Zhang , Wu Chang
- Applicant: LSI Corporation
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Suiter Swantz pc llo
- Main IPC: H03M13/00
- IPC: H03M13/00 ; G06F11/00

Abstract:
Systems and methods for computing sign disagreement between signals may implement one or more operations including, but not limited to: receiving an extrinsic log likelihood ratio (LLR) value; incrementing a sign-disagreement counter according to a sign disagreement between the extrinsic LLR value and an a priori LLR value; providing a value of the sign-disagreement counter to a binary short media defect (SMD) detector; and detecting one or more consecutive sign disagreements between an extrinsic output of a detector and an extrinsic output of a decoder.
Public/Granted literature
- US20140095963A1 PATTERN-DEPENDENT SHORT MEDIA DEFECT DETECTION Public/Granted day:2014-04-03
Information query
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