Invention Grant
- Patent Title: Non real-time metrology data management
- Patent Title (中): 非实时计量数据管理
-
Application No.: US13717462Application Date: 2012-12-17
-
Publication No.: US09027035B2Publication Date: 2015-05-05
- Inventor: Samuel Lee Whitfield , Gregory Shane Barrett , Michael Clarence Miller , Kevin David Guthrie
- Applicant: Itron, Inc.
- Applicant Address: US WA Liberty Lake
- Assignee: Itron, Inc.
- Current Assignee: Itron, Inc.
- Current Assignee Address: US WA Liberty Lake
- Agency: Lee & Hayes, PLLC
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/46 ; G06F3/00 ; G06F13/00 ; G06F9/54 ; G07C5/08 ; H04L12/841 ; H04L12/833

Abstract:
The techniques described herein implement an operating system that can reliably process time sensitive information in non real-time manner. Thus, the operating system described herein is capable of processing an instance of time sensitive input during a time period after the instance of time sensitive input is received (e.g., at a future point in time). To accomplish this, the techniques timestamp each instance of time sensitive input when it is received at a device. The techniques then store the timestamped instance of time sensitive input in a temporary queue, and make the timestamped instance available to the operating system at a time period after the time period when it is received, as indicated by the timestamp. Additional techniques described herein prioritize the activation of a driver configured to receive the time sensitive information during a boot sequence or a reboot sequence.
Public/Granted literature
- US20140173630A1 NON REAL-TIME METROLOGY DATA MANAGEMENT Public/Granted day:2014-06-19
Information query