Invention Grant
- Patent Title: Nitride semiconductor device
- Patent Title (中): 氮化物半导体器件
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Application No.: US13764850Application Date: 2013-02-12
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Publication No.: US09029915B2Publication Date: 2015-05-12
- Inventor: Wataru Saito , Hidetoshi Fujimoto , Takao Noda , Yasunobu Saito , Tomohiro Nitta
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Minato-ku
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-121352 20070502
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/778 ; H01L29/861 ; H01L29/872 ; H01L29/06 ; H01L29/10 ; H01L29/20 ; H01L29/205 ; H01L29/40

Abstract:
A semiconductor device includes: a first semiconductor layer made of an AlxGa1-xN (0≦x
Public/Granted literature
- US20130153966A1 SEMICONDUCTOR DEVICE Public/Granted day:2013-06-20
Information query
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