Invention Grant
- Patent Title: Method for thermal stabilization of probe card and inspection apparatus
- Patent Title (中): 探针卡和检查装置的热稳定方法
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Application No.: US13978411Application Date: 2011-12-09
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Publication No.: US09030218B2Publication Date: 2015-05-12
- Inventor: Kazunari Ishii , Tetsuji Watanabe , Shinya Koizumi , Koichi Matsuzaki
- Applicant: Kazunari Ishii , Tetsuji Watanabe , Shinya Koizumi , Koichi Matsuzaki
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-005013 20110113
- International Application: PCT/JP2011/079116 WO 20111209
- International Announcement: WO2012/096099 WO 20120719
- Main IPC: G01R1/073
- IPC: G01R1/073 ; G01R31/28

Abstract:
In a method for thermal stabilization of a probe card, a probe card is adjusted to a prescribed temperature in a short time by making a heat source directly contact the probe card and is accurately determined whether the probe card is thermally stable. A heat transfer substrate is mounted on a mounting table. The temperature of the heat transfer substrate is adjusted through the mounting table. The mounting table is raised, and a plurality of probes is brought into contact with the heat transfer substrate at a prescribed target load. The contact load between the heat transfer substrate and the probes, which changes according to the thermal changes in the probe card, is detected. The mounting table is controlled vertically through a vertical drive mechanism such that the contact load becomes the target load until the probe card is thermally stable.
Public/Granted literature
- US20130278279A1 METHOD FOR THERMAL STABILIZATION OF PROBE CARD AND INSPECTION APPARATUS Public/Granted day:2013-10-24
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