A high voltage tolerant I/O circuit of an electronic device is disclosed, including a voltage reducing circuit, a first node, a first transistor, a second transistor, and a control logic. The voltage reducing circuit is coupled with a signal pad and utilized for generating a reduced voltage according to an external voltage. When an internal voltage generated by an internal circuit of the electronic device is greater than the reduced voltage, the first node outputs the internal voltage as a first voltage. When the internal voltage is less than the reduced voltage, the first node outputs the reduced voltage as the first voltage. The first transistor is coupled with the signal pad and the first node. The second transistor is coupled with a second terminal of the first transistor and a fixed-voltage terminal. The control logic operates according to the first voltage to control switching operations of the second transistor.