Invention Grant
- Patent Title: Inspecting apparatus and method for inspection
- Patent Title (中): 检查仪器和检查方法
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Application No.: US12744617Application Date: 2009-07-13
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Publication No.: US09030463B2Publication Date: 2015-05-12
- Inventor: Hirotoshi Maegawa , Shinichi Kariya
- Applicant: Hirotoshi Maegawa , Shinichi Kariya
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Sony Corporation,Sony Computer Entertainment Inc.
- Current Assignee: Sony Corporation,Sony Computer Entertainment Inc.
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Gibson & Dernier LLP
- Agent Matthew B. Dernier, Esq.
- Priority: JP2008-321841 20081218
- International Application: PCT/JP2009/003278 WO 20090713
- International Announcement: WO2010/070777 WO 20100624
- Main IPC: G06T15/00
- IPC: G06T15/00 ; G09G5/00 ; G06F17/00 ; A63F13/30

Abstract:
An inspection apparatus inspects an application that is executed in a game device and displays a virtual space. The inspection apparatus comprises: an exposure indicator acquiring unit that acquires a first index relating to the exposure of an advertisement displayed in the virtual space from the game device, the index being calculated by the application that displays the virtual space from a user's point of view; an inspection image acquiring unit that acquires the virtual space, which is actually displayed on a screen on a frame by frame basis; an advertisement region extracting unit that extracts an advertisement displaying region from the image of the virtual space; an exposure indicator calculating unit that calculates a second index relating to the exposure of the advertisement based on the advertisement displaying region; and a verification unit that verifies the application by cross-checking the first index and the second index.
Public/Granted literature
- US20110050684A1 INSPECTING APPARATUS AND METHOD FOR INSPECTION Public/Granted day:2011-03-03
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |