Invention Grant
- Patent Title: Correction of a field-of-view overlay in a multi-axis projection imaging system
- Patent Title (中): 在多轴投影成像系统中校正视场覆盖
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Application No.: US13803936Application Date: 2013-03-14
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Publication No.: US09030548B2Publication Date: 2015-05-12
- Inventor: Pixuan Zhou , Chen Liang
- Applicant: DMetrix, Inc.
- Applicant Address: US AZ Tucson
- Assignee: DMetrix, Inc.
- Current Assignee: DMetrix, Inc.
- Current Assignee Address: US AZ Tucson
- Agency: Quarles & Brady LLP
- Agent Yakov Sidorin
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/36

Abstract:
Two-dimensional scanning array microscope system, which has fields of view of individual objectives overlapping at the object, produces a composite image of the object that is devoid of optical distortions caused by such overlapping. Method for processing imaging data with the system includes precise identification of detector pixels corresponding to different portions of multiple image swaths projected on the detector by the system during the scan of the object, and, based on such identification, allocating or assigning of detector pixels that receive light from the object through more than one objective to only one of objectives, thereby correcting imaging data received in real time to remove a portion of data corresponding to image overlaps.
Public/Granted literature
- US20130242079A1 CORRECTION OF A FIELD-OF-VIEW OVERLAY IN A MULTI-AXIS PROJECTION IMAGING SYSTEM Public/Granted day:2013-09-19
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