Invention Grant
US09030734B2 Scanning microscope, and method for light microscopy imaging of a specimen
有权
扫描显微镜和样品的光学显微镜成像方法
- Patent Title: Scanning microscope, and method for light microscopy imaging of a specimen
- Patent Title (中): 扫描显微镜和样品的光学显微镜成像方法
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Application No.: US13978165Application Date: 2012-02-20
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Publication No.: US09030734B2Publication Date: 2015-05-12
- Inventor: Werner Knebel , Arnold Giske
- Applicant: Werner Knebel , Arnold Giske
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Crowell & Moring LLP
- Priority: DE102011000835 20110221
- International Application: PCT/EP2012/052863 WO 20120220
- International Announcement: WO2012/113752 WO 20120830
- Main IPC: G02B21/06
- IPC: G02B21/06 ; G02B26/08 ; G02B26/10 ; G02B26/12 ; G01N21/64 ; G02B21/00

Abstract:
A scanning microscope is described, having an illumination unit for emitting an illumination light beam, an objective for generating an elongated illumination focus in a specimen to be imaged, and a scanning apparatus for moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective. The scanning apparatus directs the illumination light beam onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis of the objective, and modifies the direction of incidence of the illumination light beam within that sub-region in order to move the illumination focus over the target region to be illuminated.
Public/Granted literature
- US20130335818A1 Scanning Microscope, and Method for Light Microscopy Imaging of a Specimen Public/Granted day:2013-12-19
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