Invention Grant
- Patent Title: Charge pump circuit and memory
- Patent Title (中): 电荷泵电路和存储器
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Application No.: US14143033Application Date: 2013-12-30
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Publication No.: US09030891B2Publication Date: 2015-05-12
- Inventor: Guangjun Yang
- Applicant: Shanghai Huahong Grace Semiconductor Manufacturing Corporation
- Applicant Address: CN Shanghai
- Assignee: Shanghai Huahong Grace Semiconductor Manufacturing Corporation
- Current Assignee: Shanghai Huahong Grace Semiconductor Manufacturing Corporation
- Current Assignee Address: CN Shanghai
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: CN201310029800 20130125
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C5/14

Abstract:
Charge pump circuit and memory are provided. The charge pump circuit includes a clock driving unit, a voltage boosting unit, a boosting swing control unit, a first and second NMOS tubes, a first and second current mirror units. The clock driving unit is adapted to form and output clock driving signals to the voltage boosting unit. The voltage boosting unit is adapted to boost voltage and output it to the boosting swing control unit and the first current minor unit. The boosting swing control unit is adapted to output boosting swing control signals to the first NMOS tube. The first current minor unit is to output first mirror current and the second current minor unit is to minor the first mirror current and output second minor current. Frequency of the clock driving signal varies with leakage current load, and size of the charge pump circuit and power consumption are reduced.
Public/Granted literature
- US20140211575A1 Charge Pump Circuit and Memory Public/Granted day:2014-07-31
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