Invention Grant
- Patent Title: Temperature measurement and control for laser and light-emitting diodes
- Patent Title (中): 激光和发光二极管的温度测量和控制
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Application No.: US14072492Application Date: 2013-11-05
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Publication No.: US09031103B2Publication Date: 2015-05-12
- Inventor: Leo Del Castillo , Dawson Yee
- Applicant: Microsoft Corporation
- Applicant Address: US WA Redmond
- Assignee: Microsoft Technology Licensing, LLC
- Current Assignee: Microsoft Technology Licensing, LLC
- Current Assignee Address: US WA Redmond
- Agent Ladislav Kusnyer; Judy Yee; Micky Minhas
- Main IPC: H01S3/04
- IPC: H01S3/04 ; H01S5/068 ; H05B33/08 ; H01S5/024 ; H01S5/06 ; H01S5/0683

Abstract:
The existing diodes in an LED or laser diode package are used to measure the junction temperature of the LED or laser diode. The light or laser emissions of a diode are switched off by removing the operational drive current applied to the diode package. A reference current, which can be lower the operational drive current, is applied to the diode package. The resulting forward voltage of the diode is measured using a voltage measurement circuit. Using the inherent current-voltage-temperature relationship of the diode, the actual junction temperature of the diode can be determined. The resulting forward voltage can be used in a feedback loop to provide temperature regulation of the diode package, with or without determining the actual junction temperature. The measured forward voltage of a photodiode or the emissions diode in a diode package can be used to determine the junction temperature of the emissions diode.
Public/Granted literature
- US20140056322A1 Temperature Measurement And Control For Laser And Light-Emitting Diodes Public/Granted day:2014-02-27
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