Invention Grant
US09031197B2 Method for detecting the true coincidence of two charge pulses on adjacent picture elements, X-ray detector and X-ray image recording apparatus
有权
用于检测相邻像素上的两个充电脉冲的真实重合的方法,X射线检测器和X射线图像记录装置
- Patent Title: Method for detecting the true coincidence of two charge pulses on adjacent picture elements, X-ray detector and X-ray image recording apparatus
- Patent Title (中): 用于检测相邻像素上的两个充电脉冲的真实重合的方法,X射线检测器和X射线图像记录装置
-
Application No.: US13562236Application Date: 2012-07-30
-
Publication No.: US09031197B2Publication Date: 2015-05-12
- Inventor: Martin Spahn
- Applicant: Martin Spahn
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: King & Spalding L.L.P.
- Priority: DE102011080077 20110729
- Main IPC: G01T1/172
- IPC: G01T1/172 ; G01T1/24 ; G01N23/04 ; H04N5/32 ; G01T1/20 ; G01T1/29

Abstract:
With the aid of discriminators on a picture element of an X-ray detector, digital outputs are generated that indicate energy intervals to which X-ray quanta are allocated. If this occurs for adjacent picture elements, a distinction may be made between true coincidences, in which k-fluorescence photons play a part, and random coincidences in which two primary quanta randomly strike adjacent picture elements. The energy of the primary quantum may also be at least roughly reconstructed in the case of true coincidences. An energy-triggering measurement may thereby be provided to the extent that different materials of a picture object should be distinguished.
Public/Granted literature
Information query