Invention Grant
US09031201B2 X-ray source, X-ray imaging apparatus, and X-ray computed tomography imaging system
有权
X射线源,X射线成像装置和X射线计算机断层成像系统
- Patent Title: X-ray source, X-ray imaging apparatus, and X-ray computed tomography imaging system
- Patent Title (中): X射线源,X射线成像装置和X射线计算机断层成像系统
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Application No.: US13808194Application Date: 2011-06-20
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Publication No.: US09031201B2Publication Date: 2015-05-12
- Inventor: Genta Sato
- Applicant: Genta Sato
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2010-153225 20100705
- International Application: PCT/JP2011/064607 WO 20110620
- International Announcement: WO2012/005128 WO 20120112
- Main IPC: A61B6/03
- IPC: A61B6/03 ; H01J35/00 ; G21K3/00 ; G01N23/223 ; G01N23/20 ; G21K1/06 ; G01N23/04 ; H01J35/18 ; A61B6/00

Abstract:
An X-ray imaging apparatus includes: an X-ray source including an electron source and a target, the target having a plurality of projections, each having an emitting surface; a diffraction grating configured to diffract X rays emitted from the X-ray source; and a detector configured to detect the X rays diffracted by the diffraction grating. Electron beams output from the electron source are incident on the emitting surfaces so that X rays are emitted from the emitting surfaces and are output to the diffraction grating. The X rays emitted from the emitting surfaces are diffracted by the diffraction grating so as to form a plurality of interference patterns. The projections are arranged such that bright portions of the interference patterns overlap each other and such that dark portions thereof overlap each other. Distances from the emitting surfaces to the diffraction grating are equal to each other.
Public/Granted literature
- US20130108012A1 X-RAY SOURCE, X-RAY IMAGING APPARATUS, AND X-RAY COMPUTED TOMOGRAPHY IMAGING SYSTEM Public/Granted day:2013-05-02
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