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US09031331B2 Metric learning for nearest class mean classifiers 有权
最近类平均分类器的度量学习

Metric learning for nearest class mean classifiers
Abstract:
A classification system and method enable improvements to classification with nearest class mean classifiers by computing a comparison measure between a multidimensional representation of a new sample and a respective multidimensional class representation embedded into a space of lower dimensionality than that of the multidimensional representations. The embedding is performed with a projection that has been learned on labeled samples to optimize classification with respect to multidimensional class representations for classes which may be the same or different from those used subsequently for classification. Each multidimensional class representation is computed as a function of a set of multidimensional representations of labeled samples, each labeled with the respective class. A class is assigned to the new sample based on the computed comparison measures.
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