A microlens for an organic EL element includes a cured resin layer having concavities and convexities formed on a surface thereof, wherein when a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing a shape of the concavities and convexities by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wave number is 0 μm−1, and the circular or annular pattern is present within a region where an absolute value of wave number is within a range of 1 μm−1 or less. The microlens is disposed on a light-emitting surface of the organic EL element.