Invention Grant
- Patent Title: Vertical resistance memory device and a read method thereof
- Patent Title (中): 垂直电阻存储器件及其读取方法
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Application No.: US13708018Application Date: 2012-12-07
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Publication No.: US09036398B2Publication Date: 2015-05-19
- Inventor: Jintaek Park , Youngwoo Park , Jungdal Choi
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics, Co., Ltd.
- Current Assignee: Samsung Electronics, Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2012-0019764 20120227
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/21 ; G11C13/00

Abstract:
A read method of a vertical resistance memory device including resistance memory cells arranged in a three-dimensional array includes selecting a block from a plurality of blocks, applying a read voltage to a word line selected from word lines of the block, applying a sensing reference voltage to bit lines sharing the plurality of blocks, applying a string selection voltage to a string selection transistor through a string selection line selected from a plurality of string selection lines of the block, wherein the string selection line is connected to a gate of the string selection transistor; and determining a memory state of a memory cell selected from the plurality of resistance memory cells by the word line and the string selection line based on a current flowing through the memory cell, wherein the word line is connected through a corresponding horizontal electrode to the memory cell.
Public/Granted literature
- US20130223127A1 VERTICAL RESISTANCE MEMORY DEVICE AND A READ METHOD THEREOF Public/Granted day:2013-08-29
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