Invention Grant
- Patent Title: Mitigating variations arising from simultaneous multi-state sensing
- Patent Title (中): 同时进行多状态检测的减轻变化
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Application No.: US13333799Application Date: 2011-12-21
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Publication No.: US09036415B2Publication Date: 2015-05-19
- Inventor: Eran Sharon
- Applicant: Eran Sharon
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies Inc.
- Current Assignee: SanDisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Vierra Magen Marcus LLP
- Main IPC: G11C5/14
- IPC: G11C5/14 ; G11C11/56 ; G06F11/10

Abstract:
Methods and devices for mitigating sensing variations that may arise from simultaneous multi-threshold (SMT) sensing are provided. During SMT sensing, two or more different bias conditions may be used to simultaneously sense two different threshold voltages. However, there may be variances in the threshold voltage shift of memory cells when read with a different bias condition than was used to verify. In one embodiment each programmed state is read using both (or all) bias conditions that were used during SMT verify. In other words, two (or more) different sense operations are used to read each memory cell. The data from these different sense operations may be used to compute initialization values (e.g., LLRs, LRs, probabilities) for an ECC decoder. In one embodiment, this technique is only performed when a normal read fails.
Public/Granted literature
- US20130163330A1 MITIGATING VARIATIONS ARISING FROM SIMULTANEOUS MULTI-STATE SENSING Public/Granted day:2013-06-27
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