Invention Grant
- Patent Title: Tire defect detection method
- Patent Title (中): 轮胎缺陷检测方法
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Application No.: US14117893Application Date: 2012-05-17
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Publication No.: US09036893B2Publication Date: 2015-05-19
- Inventor: Munetoshi Imada , Hirokatsu Mizukusa , Toshihiko Iwatani , Hiroyasu Koshimizu , Takayuki Fujiwara
- Applicant: Munetoshi Imada , Hirokatsu Mizukusa , Toshihiko Iwatani , Hiroyasu Koshimizu , Takayuki Fujiwara
- Applicant Address: JP Osaka JP Osaka
- Assignee: Sharp Kabushiki Kaisha,Toyo Tire & Rubber Co., Ltd.
- Current Assignee: Sharp Kabushiki Kaisha,Toyo Tire & Rubber Co., Ltd.
- Current Assignee Address: JP Osaka JP Osaka
- Agency: Keating & Bennett, LLP
- Priority: JP2011-110874 20110517
- International Application: PCT/JP2012/062693 WO 20120517
- International Announcement: WO2012/157716 WO 20121122
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B11/30 ; G01N21/95 ; G01N21/952 ; G01M17/02 ; G06T5/00 ; G06T7/00

Abstract:
Provided is a tire defect detection method capable of accurately detecting a thinly extending convex defect of a tire surface. Prior to the start of Step S1, two-dimensional images including a slit light image are successively obtained in advance. In Step S1, a slit light image is extracted from data of a plurality of shot two-dimensional images. In Step S2, an eccentricity component which is deviation resulting from eccentricity is eliminated from the extracted slit light image. In Step S3, a feature quantity is calculated based on the light image from which the eccentricity component is eliminated, and in Step S4, a thinly extending convex defect is detected based on the calculated feature quantity.
Public/Granted literature
- US20140086453A1 TIRE DEFECT DETECTION METHOD Public/Granted day:2014-03-27
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